Wafer Edge Profile Monitor LEP-2200FE

Wafer Edge Profile Monitor LEP-2200FE
Display
Display
Repeatability
σ
Edge Length 1μm(Type A,B)
2μm(Type C)
Angle0.1°
Radius (R) 5.0μm
Thickness 0.5μm
Notch Length 2μm
Angle 0.1°
Radius (Vr) 5μm
Diameter3µm
Notch chamfering
width (Option)
1µm
TSV/BSI process TOP

Kobelco Research Institute, Inc. LEO Division
Sales(Tokyo)/9-12 Kita-Shinagawa, 5-Chome, Shinagawa-ku, TOKYO, 141-8688, JAPAN [TEL]81-3-5739-6820 [FAX]81-3-5739-6393
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