Si Brick Internal Inspection System

Si Brick Internal Inspection System Outline

Measurement Items

This system can detect internal defects, foreign materials (Ex. SiC, SiN), bubbles and cracks.

System Lineup

※Contact us or model.

System Features

・Detection of internal Defect of Si Brick by infrared camera

・Non-contact and non-destructive measurement

・Mapping view of defect images is possible

Mapping of shade picture taken by infrared camera

Threshold value about the binary coded processing of　the shade picture can be input arbitrarily

Option

・ The "BII-1100/M" has the automatic marking function by the threshold setting and it also has the manual marking function by the operator.

Observation