Laser-Electronics-Optics
（LEO）
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- Laser-Electronics-Optics（LEO）
Business Overview
We pride ourselves being the expert specifically for Laser Electron, Optics.
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- Flatness・profile Measurement System
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Broadly used for optimization of wafer edge processing and inspection for shipping.
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- Edge/Notch Profile Measurement System
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By our unique optical image processing technology, high precision edge/notch measurement is possible.
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- Makyo System
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for control of wafer polishing process, delivery inspection and control of heat treatment products.
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- Bonding Evaluation・Edge Defect Inspection System
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will detect defects such as fine scratches and cracks near the edge.
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- Sorting System・Transfer Machine
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Any combination of measurement menu is available.
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- Lifetime Measuring System
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Carrier recombination lifetime is measured with system.
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- Thin Film evaluation system for FPD
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for valuation of the crystallinity of LTPS without contact and distruction.
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- Si Semiconductors
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The time-change of carriers injected into sample by laser will be detected by the reflected power of microwave.
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- Power Semiconductors
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Evaluation of various the wide band gap semiconductor is possible.
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- Application to TSV・BSI field
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- FPD
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- LED(Sapphire)
Measurement Services
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Flatness/Profile Measurement
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Edge Profile Measurement
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Makyo Measurement
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Lifetime Measurement