LEO Laser-Electronics-Optics 高い技術と豊富な実績であらゆるニーズにお応えします

What’s NewMore news releases

We are exhibiting at SEMICON Japan 2017
We are exhibiting at SEMICON Japan 2016
TOKYO office will relocated
We are exhibiting at SEMICON Japan 2015
  • Lifetime Measuring System

    Carrier recombination lifetime is measured with system.

  • Thin Film evaluation system
    for FPD

    for valuation of the crystallinity of LTPS without contact and distruction.

  • Flatness・
    profile Measurement System

    Broadly used for optimization of wafer edge processing and inspection for shipping.

  • Makyo System

    for control of wafer polishing process, delivery inspection and control of heat treatment products.

  • Edge/Notch Profile
    Measurement System

    By our unique optical image processing technology, high precision edge/notch measurement is possible.

  • Edge Roll Off Measuring System

    Automatic measurement is posible for thickness, chamfer, width of the wafer edge and also the wafer diameter , length of orientation flat and notch shape.

  • Sorting System・Transfer Machine

    Any combination of measurement menu is available.

  • Bonding Evaluation・
    Edge Defect Inspection System

    will detect defects such as fine scratches and cracks near the edge.

Measurement Services