製品一覧

SYSTEM

  • Flatness・profile Measurement System

    Flatness・profile Measurement System
    Broadly used for optimization of wafer edge processing and inspection for shipping.

    System detail

  • Edge/Notch Profile Measurement System

    Edge/Notch Profile Measurement System
    By our unique optical image processing technology, high precision edge/notch measurement is possible.

    System detail

  • Makyo System

    Makyo System
    for control of wafer polishing process, delivery inspection and control of heat treatment products.

    System detail

  • Bonding Evaluation・Edge Defect Inspection System

    Bonding Evaluation・Edge Defect Inspection System
    will detect defects such as fine scratches and cracks near the edge.

    System detail

  • Sorting System・Transfer Machine

    Sorting System・Transfer Machine
    Any combination of measurement menu is available.

    System detail

  • Lifetime Measuring System

    Lifetime Measuring System
    Carrier recombination lifetime is measured with system.

    System detail

  • Thin Film evaluation system for FPD

    Thin Film evaluation system for FPD
    for valuation of the crystallinity of LTPS without contact and distruction.

    System detail

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