ライフタイム測定装置

Power Semiconductor Device

Evaluation of various the wide band gap semiconductor is possible.

SiC

img_powor02.png

other materials such as Si , GaN , GaAs GaN on Si

The following evaluation are also possible in addition to the μ-PCD evaluation.
・Flatness/Profile Measurement
・Makyo Observation
・Edge Profile Measurement
・Edge Roll Off Measurement

PAGETOP